Ultramicroscopy

Non-destructive analysis on nano-textured surface of the vertical LED for light enhancement

High quality ultrafast transmission electron microscopy using resonant microwave cavities

Charge accumulation in electron cryomicroscopy

Microscopic charge fluctuations cause minimal contrast loss in cryoEM

In situ electrochemical AFM monitoring of the potential-dependent deterioration of platinum catalyst during potentiodynamic cycling

Spatial dimensions in atomic force microscopy: Instruments, effects, and measurements

Indexing electron backscatter diffraction patterns with a refined template matching approach

Applications of multivariate statistical methods and simulation libraries to analysis of electron backscatter diffraction and transmission Kikuchi diffraction datasets

High dose efficiency atomic resolution imaging via electron ptychography

Application of the pattern matching approach for EBSD calibration and orientation mapping, utilising dynamical EBSP simulations