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Ieee Electron Device Letters

Ieee Electron Device Letters杂志,由Institute of Electrical and Electronics Engineers Inc.出版,于1980年创刊,Monthly,出版语言English,ISSN:0741-3106,E-ISSN:1558-0563。

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Ieee Electron Device Letters
Ieee Electron Device Letters
Ieee Electron Device Letters
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国家 / 地区 发文量
CHINA MAINLAND 577
USA 282
South Korea 174
Taiwan 123
Japan 65
England 60
India 49
Belgium 37
GERMANY (FED REP GER) 37
France 32

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CHINESE ACADEMY OF SCIENCES 84
UNIVERSITY OF CALIFORNIA SYSTEM 70
XIDIAN UNIVERSITY 56
NATIONAL YANG MING CHIAO TUNG UNIVERSIT... 49
HONG KONG UNIVERSITY OF SCIENCE & TECHN... 48
PEKING UNIVERSITY 42
UNIVERSITY OF ELECTRONIC SCIENCE & TECH... 42
INDIAN INSTITUTE OF TECHNOLOGY SYSTEM (... 36
IMEC 35
NATIONAL SUN YAT SEN UNIVERSITY 35

文章引用情况

1
Fabrication of Pd-Decorated MoSe2 Nanoflowers and Density Functional Theory Simulation Toward Ammonia Sensing

引用次数:14

2
Compatibility of HfN Metal Gate Electrodes With Hf0.5Zr0.5O2 Ferroelectric Thin Films for Ferroelectric Field-Effect Transistors

引用次数:14

3
A 1.9-kV/2.6 m Omega.cm(2) Lateral GaN Schottky Barrier Diode on Silicon Substrate With Tungsten Anode and Low Turn-ON Voltage of 0.35 V

引用次数:13

4
Flexible Pressure Sensor With High Sensitivity and Low Hysteresis Based on a Hierarchically Microstructured Electrode

引用次数:13

5
3.8W/mm RF Power Density for ALD Al2O3-Based Two-Dimensional Hole Gas Diamond MOSFET Operating at Saturation Velocity

引用次数:13

6
High Breakdown Voltage in RF AlN/GaN/AlN Quantum Well HEMTs

引用次数:13

7
Effects of Capping Electrode on Ferroelectric Properties of Hf0.5Zr0.5O2 Thin Films

引用次数:13

8
A High-Gain Inverter With Low-Temperature Poly-Si Oxide Thin-Film Transistors

引用次数:13

9
Current Carrying Capacity of Quasi-1D ZrTe3 Van Der Waals Nanoribbons

引用次数:12

10
820-V GaN-on-Si Quasi-Vertical p-i-n Diodes With BFOM of 2.0 GW/cm(2)

引用次数:12