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Ieee Design & Test

Ieee Design & Test杂志,由IEEE Computer Society出版,于2013年创刊,6 issues/year,出版语言English,ISSN:2168-2356,E-ISSN:2168-2364。

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Ieee Design & Test
Ieee Design & Test
Ieee Design & Test
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文章引用情况

1
A Survey on Architecture Advances Enabled by Emerging Beyond-CMOS Technologies

引用次数:1

2
Q-Learning-Based Voltage-Swing Tuning and Compensation for 2.5-D Memory-Logic Integration

引用次数:1

3
Composable Battery Model Templates Based on Manufacturers' Data

引用次数:1

4
Testable Design of Reversible Circuits Using Parity Preserving Gates

引用次数:1

5
Designing Safe and Secure Industrial Control Systems: A Tutorial Review

引用次数:1

6
On-Chip RF Phased Array Characterization with DC-Only Measurements for In-Field Calibration

引用次数:1

7
Adaptive Approximate Computing in Arithmetic Datapaths

引用次数:1

8
A Diacnosable Network-on-Chip for FPGA Verification of Intellectual Properties

引用次数:1

9
A Highly Integrated Hardware/Software Co-Design and Co-Verification Platform

引用次数:1

10
SmartPatch: A Self-Powered and Patchable Cumulative UV Irradiance Meter

引用次数:1