Journal Of Electronic Testing-theory And Applications

RSBST: an Accelerated Automated Software-Based Self-Test Synthesis for Processor Testing

Golden-Free Processor Hardware Trojan Detection Using Bit Power Consistency Analysis

A Classification Approach for an Accurate Analog/RF BIST Evaluation Based on the Process Parameters

Dynamic Analog/RF Alternate Test Strategies Based on On-chip Learning

Identification of Random/Clustered TSV Defects in 3D IC During Pre-Bond Testing

Count Your Toggles: a New Leakage Model for Pre-Silicon Power Analysis of Crypto Designs

Application of Machine Learning Techniques in Post-Silicon Debugging and Bug Localization

Measurement of Nonlinear Dielectric Behaviour of Semiconductor Material Under Microwave Field in Dual-Mode Rectangular Cavity

Analytical Models for the Evaluation of Resistive Short Defect Detectability in Presence of Process Variations: Application to 28nm Bulk and FDSOI Technologies

Design of Two-Tone RF Generator for On-Chip IP3/IP2 Test