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Journal Of Electronic Testing-theory And Applications

Journal Of Electronic Testing-theory And Applications杂志,由Springer US出版,于1990年创刊,Bimonthly,出版语言English,ISSN:0923-8174,E-ISSN:1573-0727。

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Journal Of Electronic Testing-theory And Applications
Journal Of Electronic Testing-theory And Applications
Journal Of Electronic Testing-theory And Applications
SCI SCIE

杂志介绍

JCR分区
Q4
中科院分区
4区
影响因子
1.2
CiteScore
2.7
期刊收录
SCI、SCIE

Journal Of Electronic Testing-theory And Applications(中文译名:《电子测试理论与应用杂志》),ISSN:0923-8174,EISSN:1573-0727,是Springer US出版的国际性学术期刊,创刊于1990年,以Bimonthly形式稳定发行,2026年总发文量约44篇。该刊采用非OA开放访问,学科归属为工程技术 - 工程:电子与电气。该刊是工程技术、工程电子与电气领域的国际权威刊物,已被SCI(科学引文索引)、SCIE(科学引文索引扩展版)等国际主流学术数据库收录。2026年期刊影响因子达1.2,2025年期刊CiteScore为2.7,2025年期刊自引率约8.3%,在中科院期刊分区体系中位列工程技术大类4区,在所属学科领域具备高学术影响力与国际认可度。Journal Of Electronic Testing-theory And Applications长期聚焦工程技术、工程电子与电气及相关产业的技术应用前沿,平均审稿周期较慢,6-12周,审稿流程高效稳定。在稿件录用评判中,该刊将创新性与前沿性作为核心遴选标准,重点收录能够对工程技术、工程电子与电气领域的落地与发展产生实质性推动价值的研究成果。

期刊评价

名词解释:

影响因子(Impact Factor, IF):指该期刊前两年发表的文章,在第三年的平均被引用次数。它反映了期刊的近期平均影响力和热度。

中科院分区:中科院分区表是国内主流的学术期刊分级评价工具,核心意义是建立跨学科可比的统一评价标尺,为职称评审、学位授予、科研立项等科研管理工作提供标准化量化依据,同时帮助科研人员筛选优质期刊、规避学术风险,适配国内本土化的科研评价需求。

期刊分区表

《新锐期刊分区表》(2026年3月发布)

大类学科 小类学科 Top期刊 综述期刊
工程技术
4区
ENGINEERING, ELECTRICAL & ELECTRONIC 工程:电子与电气
4区

期刊分区表(2025年3月升级版)

大类学科 小类学科 Top期刊 综述期刊
工程技术
4区
ENGINEERING, ELECTRICAL & ELECTRONIC 工程:电子与电气
4区

期刊分区表(2023年12月升级版)

大类学科 小类学科 Top期刊 综述期刊
工程技术
4区
ENGINEERING, ELECTRICAL & ELECTRONIC 工程:电子与电气
4区

JCR分区

2025-2026年最新版

按JCI指标学科分区 收录子集 分区 排名 百分位
学科:ENGINEERING, ELECTRICAL & ELECTRONIC SCIE Q4 310 / 369

16.1

学科:ENGINEERING, ELECTRICAL & ELECTRONIC SCIE Q4 295 / 371

20.62

2024-2025年最新版

按JCI指标学科分区 收录子集 分区 排名 百分位
学科:ENGINEERING, ELECTRICAL & ELECTRONIC SCIE Q4 282 / 368

23.5

学科:ENGINEERING, ELECTRICAL & ELECTRONIC SCIE Q4 304 / 368

17.53


中国学者近期发文

1
Dynamic Meta-Learning with Attentional Prototypes for Few-Shot Wafer Defect Recognitio

Author:Ni, Tianming; Yu, Meifang; Chen, Xiaofei; Liang, Huaguo; Wang, Senling; Cheng, Muyang; Nie, Mu

Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. 2026; Vol. , Issue , pp. -. DOI: 10.1007/s10836-026-06224-7

2
Study on Analysis and Troubleshooting Methods for Common Faults of a Certain Type of On-board Recorde

Author:Wang, Ning; Fan, Xiang; Zhou, Zhenquan; Zheng, Lihong

Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. 2026; Vol. , Issue , pp. -. DOI: 10.1007/s10836-026-06230-9

3
ResNeSt Wafer Map Defect Pattern Recognition Based on the Multi-attention Mechanism and Enhanced Activation Functio

Author:Chen, Shouhong; Han, Lingfeng; Wei, Cong; Zhu, Ziren; Hou, Xingna; Guo, Ling

Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. 2026; Vol. , Issue , pp. -. DOI: 10.1007/s10836-026-06229-2

4
An Efficient Cybersecurity Method to Detect Phishing Attacks Integrating Heuristic-Driven Feature Optimizer and Deep Learning Algorithm

Author:Li, Shaoju; Bouyer, Asgarali; Arasteh, Bahman

Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. 2026; Vol. , Issue , pp. -. DOI: 10.1007/s10836-026-06233-6

5
SAF-YOLO: a Semantic-Aware Lightweight Framework for Fine-Grained PCB Defect Detectio

Author:Du, Xianjun; Wang, Jingxiang

Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. 2026; Vol. , Issue , pp. -. DOI: 10.1007/s10836-026-06220-x

6
SRAM PUF Preselection Method Based on Neighboring Spatial Majority Votin

Author:Shi, Tianyao; Chen, Sining; Chen, Haijin

Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. 2026; Vol. , Issue , pp. -. DOI: 10.1007/s10836-025-06214-1

7
Average Relative SNR: New Metric to Evaluate the Attack Performance of Non-Profiled Side-Channel Trace

Author:Tang, Cheng; Li, Lang

Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. 2026; Vol. , Issue , pp. -. DOI: 10.1007/s10836-026-06218-5

8
PN-SCA: A High Generalization and Fast Profiled SCA Based on Prototypical Network

Author:Ou, Yu; Wei, Yongzhuang; Ou, Changhai; Pasalic, Enes

Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. 2026; Vol. , Issue , pp. -. DOI: 10.1007/s10836-026-06219-4

9
PFSA: Pseudo Fault Sensitization Attack on Logic Locking via Key-invalidatio

Author:Zhang, Lei; Liu, Xuejun; Lei, Dengyun; Liao, Danpeng; Liu, Yuan

Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. 2026; Vol. , Issue , pp. -. DOI: 10.1007/s10836-025-06208-z

10
Cross-Domain Multi-Label Prediction of Metamorphic Relation Patterns Leveraging Multimodal Feature

Author:Li, Zhenqiu; Wu, Tingting; Chen, Sihui; Jiang, Mingyue; Ding, Zuohua; Dong, Yunwei

Journal: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. 2025; Vol. , Issue , pp. -. DOI: 10.1007/s10836-025-06179-1


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Journal Of Electronic Testing-theory And Applications

国际简称:J ELECTRON TEST参考译名:电子测试理论与应用杂志

年发文量:44 CiteScore:2.7 是否预警:否 Gold OA文章占比:10.00% 研究类文章占比:100.00%

杂志社联系方式:SPRINGER, VAN GODEWIJCKSTRAAT 30, DORDRECHT, NETHERLANDS, 3311 GZ

Journal Of Electronic Testing-theory And Applications